X-ray Line-Scan Detectors for quality control, cargo screening, and non-destructive testing (NDT)
X-Scan Imaging Corporation headquartered in San Jose, California is a leading domestic manufacturer of high-performance, CMOS Linear Diode Arrays (LDA), CMOS & CCD Time Delayed Integration (TDI) detectors and line-scan camera systems designed for both visible and radiographic imaging applications.
TDI is an established and effective scanning technology capable of increasing exposure times over conventional LDA systems without compromising scanning speed and inspection time. TDI also offers particular advantages when used in high-energy x-ray, gamma-ray, and neutron-ray imaging applications.
X-Scan’s unique device structure and shielding design offers users reliable high-speed x-ray imaging and extended operating lifetime in a broad range of laboratory and on-line production and inspection environments, including automated product quality inspection, non-destructive testing (NDT), and computed tomography (CT). Other applications include printed circuit board inspection, weld inspection, automotive wheel and tire inspection, food/pharmaceutical inspection, precious art and currency examination, and cargo screening.